Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 23.53 MB
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461304911
Size: 42.74 MB
Format: PDF, Mobi
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In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA.

Physical Principles Of Electron Microscopy

Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Size: 69.58 MB
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At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Practical Scanning Electron Microscopy

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Size: 63.86 MB
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In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

X Ray Photoelectron Spectroscopy

Author: Paul van der Heide
Publisher: John Wiley & Sons
ISBN: 1118162900
Size: 33.53 MB
Format: PDF, ePub
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This book introduces readers interested in the field of X-ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field.

Scanning Electron Microscope Optics And Spectrometers

Author: Anjam Khursheed
Publisher: World Scientific
ISBN: 9812836675
Size: 29.90 MB
Format: PDF, Mobi
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This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research.

Atomic Force Microscopy

Author: Greg Haugstad
Publisher: John Wiley & Sons
ISBN: 1118360680
Size: 25.76 MB
Format: PDF, Kindle
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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).